Electron Traps at the Semiconductor Oxide/Electrolyte Interface

Research output: Contribution to conference › Abstract › peer-review

Translated title of the contribution	Electron Traps at the Semiconductor Oxide/Electrolyte Interface
Original language	English
Publication status	Published - 2016

49th Heyrosvský Discussion Electrochemical Interfaces at the Nanoscale, Trest, Czech Republic, 29.05.-02.06.2016

Fields of Science and Technology Classification 2012

@conference{a9c74f7a6fcd483997e01e0e8560cb08,

title = "Electron Traps at the Semiconductor Oxide/Electrolyte Interface",

author = "Oliver Diwald and Thomas Berger and A. M{\'a}rquez and G. Bourret",

note = "49th Heyrosvsk{\'y} Discussion Electrochemical Interfaces at the Nanoscale, Trest, Czech Republic, 29.05.-02.06.2016",

year = "2016",

language = "English",

}