Identification Of In-Field Sensor Defects In The Context Of Image Age Approximation

Research output: Chapter in Book/Report/Conference proceeding/Legal commentaryConference contributionpeer-review

Abstract

Image sensor defects that develop in field over a camera’s lifetime are at the core of temporal image forensics, as by knowing their onset time a temporal order can be assigned among pieces of evidence. In this context, only defects that have developed within the time interval of the available data set are relevant. The available methods for defect detection, based on regular scene images, aim to identify all present defects (e.g., to conceal them). In this paper, we introduce two novel defect detection techniques. Because of their properties, these methods only detect defects relevant for image age approximation. This is important since defects that do not provide additional age information can negatively affect the process of image age approximation.
Original languageEnglish
Title of host publication2021 IEEE International Conference on Image Processing (ICIP)
PublisherIEEE
Pages3043-3047
Number of pages5
ISBN (Print)978-1-6654-3102-6
DOIs
Publication statusPublished - 22 Sept 2021
Event2021 IEEE International Conference on Image Processing (ICIP) - Anchorage, AK, USA
Duration: 19 Sept 202122 Sept 2021

Conference

Conference2021 IEEE International Conference on Image Processing (ICIP)
Period19/09/2122/09/21

Fields of Science and Technology Classification 2012

  • 102 Computer Sciences

Cite this