Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale

Fedja J. Wendisch; Mehri Abazari; Hossein Mahdavi; Marcel Rey; Nicolas Vogel; Maurizio Musso; Oliver Diwald; Gilles R. Bourret

doi:10.1021/acsami.9b21466

Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale

Fedja J. Wendisch
, Mehri Abazari
, Hossein Mahdavi
, Marcel Rey
, Nicolas Vogel
, Maurizio Musso
, Oliver Diwald
, Gilles R. Bourret^*

^*Corresponding author for this work

Chemistry and Physics of Materials

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	13140-13147
Number of pages	8
Journal	ACS Applied Materials and Interfaces
Volume	12
Issue number	11
DOIs	https://doi.org/10.1021/acsami.9b21466 https://doi.org/10.1021/acsami.9b21466
Publication status	Published - 18 Mar 2020

Keywords

colloidal lithography
graded substrate
KOH etching
metal-assisted chemical etching
Si nanowire arrays
structural colors

Fields of Science and Technology Classification 2012

103 Physics, Astronomy
104 Chemistry

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Cite this

Wendisch, F. J., Abazari, M., Mahdavi, H., Rey, M., Vogel, N., Musso, M., Diwald, O., & Bourret, G. R. (2020). Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale. ACS Applied Materials and Interfaces, 12(11), 13140-13147. https://doi.org/10.1021/acsami.9b21466, https://doi.org/10.1021/acsami.9b21466

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title = "Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale",

keywords = "colloidal lithography, graded substrate, KOH etching, metal-assisted chemical etching, Si nanowire arrays, structural colors",

author = "Wendisch, \{Fedja J.\} and Mehri Abazari and Hossein Mahdavi and Marcel Rey and Nicolas Vogel and Maurizio Musso and Oliver Diwald and Bourret, \{Gilles R.\}",

year = "2020",

month = mar,

day = "18",

doi = "10.1021/acsami.9b21466",

language = "English",

volume = "12",

pages = "13140--13147",

journal = "ACS Applied Materials and Interfaces",

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publisher = "American Chemical Society",

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Wendisch, FJ, Abazari, M, Mahdavi, H, Rey, M, Vogel, N, Musso, M , Diwald, O & Bourret, GR 2020, 'Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale', ACS Applied Materials and Interfaces, vol. 12, no. 11, pp. 13140-13147. https://doi.org/10.1021/acsami.9b21466, https://doi.org/10.1021/acsami.9b21466

TY - JOUR

T1 - Morphology-Graded Silicon Nanowire Arrays via Chemical Etching

T2 - Engineering Optical Properties at the Nanoscale and Macroscale

AU - Wendisch, Fedja J.

AU - Abazari, Mehri

AU - Mahdavi, Hossein

AU - Rey, Marcel

AU - Vogel, Nicolas

AU - Musso, Maurizio

AU - Diwald, Oliver

AU - Bourret, Gilles R.

PY - 2020/3/18

Y1 - 2020/3/18

KW - colloidal lithography

KW - graded substrate

KW - KOH etching

KW - metal-assisted chemical etching

KW - Si nanowire arrays

KW - structural colors

UR - https://www.scopus.com/pages/publications/85081314794

UR - https://www.mendeley.com/catalogue/a949309b-3811-3bdb-ad33-b04c97cc70c6/

U2 - 10.1021/acsami.9b21466

DO - 10.1021/acsami.9b21466

M3 - Article

C2 - 32129591

AN - SCOPUS:85081314794

SN - 1944-8244

VL - 12

SP - 13140

EP - 13147

JO - ACS Applied Materials and Interfaces

JF - ACS Applied Materials and Interfaces

IS - 11

ER -

Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale

Keywords

Fields of Science and Technology Classification 2012

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InCIMa: ITAT1023 InCIMa - Intelligente Charakterisierung von intelligenten Materialien

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Morphology-Graded Silicon Nanowire Arrays via Chemical Etching: Engineering Optical Properties at the Nanoscale and Macroscale

Keywords

Fields of Science and Technology Classification 2012

Access to Document

Other files and links

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InCIMa: ITAT1023 InCIMa - Intelligente Charakterisierung von intelligenten Materialien

Cite this